Introduction to Spectroscopic Ellipsometry of Thin Film Materials
| By: | Andrew Thye Shen Wee; Xinmao Yin; Chi Sin Tang |
| Publisher: | Wiley Global Research (STMS) |
| Print ISBN: | 9783527349517 |
| eText ISBN: | 9783527833955 |
| Edition: | 1 |
| Format: | Reflowable |
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