High Resolution Focused Ion Beams: FIB and its Applications
| By: | Jon Orloff; Lynwood Swanson; Mark Utlaut |
| Publisher: | Springer Nature |
| Print ISBN: | 9780306473500 |
| eText ISBN: | 9781461507659 |
| Edition: | 0 |
| Format: | Page Fidelity |
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