Back to results
Cover image for book Power-Constrained Testing of VLSI Circuits

Power-Constrained Testing of VLSI Circuits

By:Nicola Nicolici; Bashir M. Al-Hashimi
Publisher:Springer Nature
Print ISBN:9781402072352
eText ISBN:9780306487316
Edition:0
Format:Page Fidelity

eBook Features

Instant Access

Purchase and read your book immediately

Read Offline

Access your eTextbook anytime and anywhere

Study Tools

Built-in study tools like highlights and more

Read Aloud

Listen and follow along as Bookshelf reads to you