System-on-Chip Test Architectures: Nanometer Design for Testability
| By: | Wang, Laung-Terng; Stroud, Charles E.; Touba, Nur A. |
| Publisher: | Elsevier S & T |
| Print ISBN: | 9780123739735 |
| eText ISBN: | 9780080556802 |
| Edition: | 0 |
| Format: | Page Fidelity |
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